* Memory retention voltage depends on PVT
* Leakage during memory state retention ( Data retention during standby)
* As retention time increases more errors
Solutions:
1. Voltage scaling ( as VDD reduces number of errors increases , Leakage current )
2. Error correction codes
Effect of ECC:
1. max 1 error per line can be corrected, 2 errors can be detected
2. Area: Memory size increase by (n-k)/n
small additional area for encoder and decoder units ( Fully combinational blocks)
3. Latency : Encoding latency added to write access
Decoding latency added to read access
For SEC/SED
Number of data bits No of check bits
8-11 5
12-26 6
27-57 7
58- 120 8
-> Enable/Disable ECC?
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